Kong Boon Yeap

Kong Boon Yeap

Affiliated with

Research Area

Biography

Kong Boon Yeap has not added Biography.
If you are Kong Boon Yeap and would like to personalize this page please email our Author Liaison for assistance.

JoVE Journal Publications

ArticleTotal : 1
Year
<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Publication title

Cited by 1

2015

Other Publications

Article
Year

No publications found